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Optimizing Photo-Resist Film Uniformity

 

David Crowley, Tokyo Electron Texas, Inc., Austin, TX

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Flow characteristics within the exhaust cup

Tokyo Electron Texas, Inc., (TEX) is part of a worldwide organization, Tokyo Electron Limited (TEL), a leader in semiconductor and LCD production equipment based in Japan. TEX performs research and development for Tokyo Electron’s Clean Track systems, which dominate the market because of their reputation for superior reliability and performance.

Clean Track systems are used in the photolithography process that silicon wafers undergo during microchip fabrication. They are used to coat silicon wafers with a sub-micron thick layer of photo-sensitive polymer (called photo-resist), perform baking and surface preparation processes, send the wafers to a pattern exposure tool, and develop the photo-resist after exposure. The precision of the resulting pattern is strongly dependent on the uniformity of the photo-resist thickness across the wafer. This thickness is governed by the wafer rotation speed and air flow inside the system, which is driven in part by the design of an exhaust cup, used to remove volatiles. To understand the features of two different exhaust cup designs, two models of about 1.4 million cells each were analyzed using FLUENT.

The FLUENT results were in agreement with a simulation done previously by TEX’s parent company, Tokyo Electron Kyushu (TKL), which used slightly different boundary conditions and other software tools. The results supported observations of vortices created at high spin speeds, giving engineers confidence in the simulation techniques and providing valuable information related to the modification of the exhaust cup to improve the system performance. In the future, FLUENT will be used to verify improvements to the airflow and exhaust system designs.


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